Advanced Materials

Anotácia v hlavnom jazyku práce: The advanced ceramic coatings for ultrahigh temperature applications consist of high melting point and heavy (Zr, Hf, Ru, W..) metallic elements strongly bonded with light elements (boron, nitrogen, oxygen, carbon with hydrogen) which result in difficulties in quantitative analysis when using conventional chemical methods. Usually, a combination of several analytical methods is necessary to obtain quantitative characterization of both light and heavy elements at the same time in the resulting compounds. However, the control of the coating composition requires also the control of the plasma composition during the deposition. Thus, the in situ methods of plasma composition should be combined with the methods applied to the coatings to determine the relationships controlling their chemistry, structure and properties. The work should employ both in-situ optical emission spectroscopy for the plasma control with the ex-situ glow discharge optical emission spectrocopy (GDOES), Raman spectroscopy as well as energy and wavelength disperse electron spectroscopy (and potentially also X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrocopy (SIMS)) methods on the carbide and boride based coatings for quantification of their chemistry to establish the correlations between the plasma characteristics and their structure and properties. The plasma study will be performed on the existing iPVD systems using OES system (Avantes, The Netherlands) and Raman microscope (XploRa, Horiba, France), GDOES (GD2, Horiba, France) as well as on the EDS and WDS (Oxford, UK) attached to the scanning electron microscopes. The introduction of new XPS and SIMS facilities is also anticipated.

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